Markovian model for computation of tag loss ratio in dynamic RFID systems

  1. Vales-Alonso, J.
  2. Bueno-Delgado, M.V.
  3. Egea-Lopez, E.
  4. Alcaraz-Espin, J.J.
  5. Garcia-Haro, J.
Actes de conférence:
RFID Systech 2009 - Excellence in RFID Systems and Technologies, 5th European Workshop on RFID Systems and Technologies

ISBN: 9783800731688

Année de publication: 2009

Type: Communication dans un congrès

GOOGLE SCHOLAR
La source de données: Scopus