Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications
- Suárez-Peña, B.
- Negral, L.
- Castrillón, L.
- Megido, L.
- Marañón, E.
- Fernández-Nava, Y.
Zeitschrift:
Materials
ISSN: 1996-1944
Datum der Publikation: 2016
Ausgabe: 9
Nummer: 2
Art: Artikel