Toward continuous enterprise improvement: Analysis and supporting mechanisms in the GeMM (GEneric Methodology Model) proposal
- Hawa, M.
- Ortiz, A.
- Ros, L.
- Lario, F.
Proceedings:
IEEE Symposium on Emerging Technologies and Factory Automation, ETFA
Year of publication: 1999
Volume: 1
Pages: 271-279
Type: Conference paper