Tag loss probability evaluation for a continuous flow of tags in the EPC-global standard

  1. Vales-Alonso, J.
  2. Victoria Bueno-Delgado, M.
  3. Egea-López, E.
  4. García-Haro, J.
Konferenzberichte:
RFID Technology - Concepts, Applications, Challenges - Proceedings of the 2nd International Workshop on RFID Technology - Concepts, Applications, Challenges, IWRT 2008; In Conjunction with ICEIS 2008

ISBN: 9789898111463

Datum der Publikation: 2008

Seiten: 115-126

Art: Konferenz-Beitrag

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Datenquelle: Scopus