Positioning measurement using a new artificial vision algorithm in LabVIEW based on the analysis of images on an LCD screen

  1. de Francisco Ortiz, Ó.
  2. Estrems Amestoy, M.
  3. Carrero-Blanco, J.
Aldizkaria:
International Journal of Advanced Manufacturing Technology

ISSN: 1433-3015,  0268-3768

Argitalpen urtea: 2020

Alea: 109

Zenbakia: 1-2

Orrialdeak: 155-170

Mota: Artikulua

DOI: 10.1007/S00170-020-05497-2 GOOGLE SCHOLAR
Datuen iturria: Scopus