Supervised feature learning by adversarial autoencoder approach for object classification in dual X-ray image of luggage

  1. Chouai, M.
  2. Merah, M.
  3. Sancho-Gómez, J.-L.
  4. Mimi, M.
Revue:
Journal of Intelligent Manufacturing

ISSN: 1572-8145 0956-5515

Année de publication: 2020

Volumen: 31

Número: 5

Pages: 1101-1112

Type: Article

DOI: 10.1007/S10845-019-01498-5 GOOGLE SCHOLAR