X-ray-induced degradation of OEG-terminated SAMs on silica surfaces during XPS characterization

1. Palazon, F.
2. Géhin, T.
3. Ferrah, D.
4. Garnier, A.
5. Botella, C.
6. Grenet, G.
7. Souteyrand, E.
8. Cloarec, J.-P.
9. Chevolot, Y.