Adherence of a high-speed RRP LDMOS characterization setup to JESD 24-10 standard

  1. Bernal, C.
  2. Jimenez, M.
Konferenzberichte:
LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings

ISBN: 9781509058594

Datum der Publikation: 2017

LASCAS 2017 - 8th IEEE Latin American Symposium on Circuits and Systems, R9 IEEE CASS Flagship Conference: Proceedings

Art: Konferenz-Beitrag

DOI: 10.1109/LASCAS.2017.7948100 GOOGLE SCHOLAR
Datenquelle: Scopus