Emulating an Agilent™ 4142 on a Keithley™ 2600 series source measurement unit

  1. Moreno, J.
  2. Gonzalez, O.
  3. Vega, R.
  4. Palomera, R.
  5. Jimenez, M.
Actas:
LATW2010 - 11th Latin-American Test Workshop

ISBN: 9781424477852

Ano de publicación: 2010

LATW2010 - 11th Latin-American Test Workshop

Tipo: Achega congreso

DOI: 10.1109/LATW.2010.5550376 GOOGLE SCHOLAR
Fonte de datos: Scopus