Dispositivos y Diseño Microelectrónico
DDM
Institute of Electronics, Microelectronics and Nanotechnology
Villeneuve-d'Ascq, FranciaPublicaciones en colaboración con investigadores/as de Institute of Electronics, Microelectronics and Nanotechnology (6)
2002
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Electromagnetic properties measurements of ferromagnetic materials using microstrip
Microwave and Optical Technology Letters, Vol. 33, Núm. 3, pp. 176-180
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Fast electromagnetic characterisation method of thin planar materials using coplanar line up to V-band
Electronics Letters, Vol. 38, Núm. 8, pp. 373-374
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Very high broadband electromagnetic characterization method of film-shaped materials using coplanar
Microwave and Optical Technology Letters, Vol. 33, Núm. 5, pp. 352-355
2001
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Monitoring of OSNR by using a Mach-Zehnder interferometer
Microwave and Optical Technology Letters, Vol. 30, Núm. 1, pp. 63-65
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S-parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties
Microwave and Optical Technology Letters, Vol. 30, Núm. 1, pp. 65-69
2000
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Ridged waveguide to microstrip transition for electromagnetic characterization of materials in V-band
Electronics Letters, Vol. 36, Núm. 17, pp. 1468-1470