Pascual
Campoy Cervera
Ikertzailea 2003-2003 tartean
Argitalpenak (4) Pascual Campoy Cervera argitalpenak
2003
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A convolutional neural architecture: An application for defects detection in continuous manufacturing systems
Proceedings - IEEE International Symposium on Circuits and Systems
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Defects detection in continuous manufacturing by means of convolutional neural networks
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), Vol. 2687, pp. 528-535
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InsPulp-I ©: A pulp inspection system under critical lighting conditions using TDI technology
VDI Berichte
1993
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QUALITY-CONTROL OF FERRITE CORES THROUGH ARTIFICIAL VISION TECHNIQUES
INTELLIGENT COMPONENTS AND INSTRUMENTS FOR CONTROL APPLICATIONS