Artículos (12) Publicaciones en las que ha participado algún/a investigador/a

2001

  1. Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition

    Thin Solid Films, Vol. 394, Núm. 1-2, pp. 23-28

  2. Coplanar propagation on magnetic substrates

    Microwave and Optical Technology Letters, Vol. 31, Núm. 5, pp. 365-368

  3. Electrical properties of rapid thermally annealed SiNx:H/Si structures characterized by capacitance-voltage and surface photovoltage spectroscopy

    Semiconductor Science and Technology, Vol. 16, Núm. 7, pp. 534-542

  4. Fuzzy logic in a patient supervision system

    Artificial Intelligence in Medicine, Vol. 21, Núm. 1-3, pp. 193-199

  5. Hopping conductivity and activated transport in InxGa1-xAs quantum wells

    European Physical Journal B, Vol. 24, Núm. 4, pp. 463-468

  6. Molecular models and activation energies for bonding rearrangement in plasma-deposited (formula presented) dielectric thin films treated by rapid thermal annealing

    Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 24

  7. Molecular models and activation energies for bonding rearrangement in plasma-deposited α-SiNx: H dielectric thin films treated by rapid thermal annealing

    Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 24, pp. 2453201-2453211

  8. Monitoring of OSNR by using a Mach-Zehnder interferometer

    Microwave and Optical Technology Letters, Vol. 30, Núm. 1, pp. 63-65

  9. S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties

    IEEE Microwave and Wireless Components Letters, Vol. 11, Núm. 7, pp. 305-307

  10. S-parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties

    Microwave and Optical Technology Letters, Vol. 30, Núm. 1, pp. 65-69

  11. S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties

    IEEE Microwave and Wireless Components Letters, Vol. 11, Núm. 2, pp. 80-82

  12. Temperature effects on the electrical properties and structure of interfacial and bulk defects in Al/SiNx:H/Si devices

    Journal of Applied Physics, Vol. 90, Núm. 3, pp. 1573-1581