Departamento
Electrónica, Tecnología de Computadores y Proyectos
Publicaciones (16) Publicaciones en las que ha participado algún/a investigador/a
2001
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Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition
Thin Solid Films, Vol. 394, Núm. 1-2, pp. 23-28
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Complex permittivity and permeability characterization from transmission-line measurements
Proceedings of SPIE - The International Society for Optical Engineering
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Coplanar propagation on magnetic substrates
Microwave and Optical Technology Letters, Vol. 31, Núm. 5, pp. 365-368
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Decoding the population responses of retinal ganglions cells using information theory
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
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Electrical properties of rapid thermally annealed SiNx:H/Si structures characterized by capacitance-voltage and surface photovoltage spectroscopy
Semiconductor Science and Technology, Vol. 16, Núm. 7, pp. 534-542
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Fuzzy logic in a patient supervision system
Artificial Intelligence in Medicine, Vol. 21, Núm. 1-3, pp. 193-199
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Hopping conductivity and activated transport in InxGa1-xAs quantum wells
European Physical Journal B, Vol. 24, Núm. 4, pp. 463-468
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Lattice recovery by rapid thermal annealing in Mg+-implanted InP assessed by Raman spectroscopy
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
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Molecular models and activation energies for bonding rearrangement in plasma-deposited (formula presented) dielectric thin films treated by rapid thermal annealing
Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 24
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Molecular models and activation energies for bonding rearrangement in plasma-deposited α-SiNx: H dielectric thin films treated by rapid thermal annealing
Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 24, pp. 2453201-2453211
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Monitoring of OSNR by using a Mach-Zehnder interferometer
Microwave and Optical Technology Letters, Vol. 30, Núm. 1, pp. 63-65
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S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties
IEEE Microwave and Wireless Components Letters, Vol. 11, Núm. 7, pp. 305-307
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S-parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties
Microwave and Optical Technology Letters, Vol. 30, Núm. 1, pp. 65-69
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S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties
IEEE Microwave and Wireless Components Letters, Vol. 11, Núm. 2, pp. 80-82
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Solution based on a DSP processor for high-speed processing and motion tracking of endocardial wall
Proceedings of SPIE - The International Society for Optical Engineering
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Temperature effects on the electrical properties and structure of interfacial and bulk defects in Al/SiNx:H/Si devices
Journal of Applied Physics, Vol. 90, Núm. 3, pp. 1573-1581