Temperature effects on the electrical properties and structure of interfacial and bulk defects in Al/SiNx:H/Si devices
- Martínez, F.L.
- San Andrés, E.
- Del Prado, A.
- Mártil, I.
- Bravo, D.
- López, F.J.
ISSN: 0021-8979
Argitalpen urtea: 2001
Alea: 90
Zenbakia: 3
Orrialdeak: 1573-1581
Mota: Artikulua