Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications

1. Suárez-Peña, B.
2. Negral, L.
3. Castrillón, L.
4. Megido, L.
5. Marañón, E.
6. Fernández-Nava, Y.

Export

Export

×

MLA

modern-language-association

APA

apa

Chicago

chicago-fullnote-bibliography

Harvard

harvard-cite-them-right

Vancouver

vancouver-author-date

---

RIS BibTex

Export

×

This document cannot be exported because it belongs to another portal.

Full text

lock_openFull text externo

DOI: 10.3390/MA9020109 GOOGLE SCHOLAR lock_openOpen access editor

Sustainable development goals

• 

Data source: Scopus