Analysis of the power outage effects in RFID

  1. Vales-Alonso, J.
  2. Muñoz-Gea, J.P.
  3. Alcaraz, J.J.
  4. González-Castaño, F.J.
Journal:
IEEE Communications Letters

ISSN: 1089-7798

Year of publication: 2017

Volume: 21

Issue: 2

Pages: 306-309

Type: Article

DOI: 10.1109/LCOMM.2016.2622258 GOOGLE SCHOLAR
Data source: Scopus