Defect detection in textures through the use of entropy as a means for automatically selecting the wavelet decomposition level
- Navarro, P.J.
- Fernández-Isla, C.
- Alcover, P.M.
- Suardíaz, J.
Zeitschrift:
Sensors (Switzerland)
ISSN: 1424-8220
Datum der Publikation: 2016
Ausgabe: 16
Nummer: 8
Art: Artikel