Defect detection in textures through the use of entropy as a means for automatically selecting the wavelet decomposition level

  1. Navarro, P.J.
  2. Fernández-Isla, C.
  3. Alcover, P.M.
  4. Suardíaz, J.
Aldizkaria:
Sensors (Switzerland)

ISSN: 1424-8220

Argitalpen urtea: 2016

Alea: 16

Zenbakia: 8

Mota: Artikulua

DOI: 10.3390/S16081178 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus