Thermal frequency noise in dynamic scanning force microscopy

  1. Colchero, J.
  2. Cuenca, M.
  3. Martínez, J.F.G.
  4. Abad, J.
  5. García, B.P.
  6. Palacios-Lidón, E.
  7. Abellán, J.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2011

Volume: 109

Issue: 2

Type: Article

DOI: 10.1063/1.3533769 GOOGLE SCHOLAR
Data source: Scopus