TLP Generator Setup for Reliable Switching Characterization of Commercial GaN HEMTs

  1. Bernal, C.
  2. Jimenez, M.
  3. Andrade, F.
Proceedings:
2021 IEEE 22nd Latin American Test Symposium, LATS 2021

ISBN: 9781665420570

Year of publication: 2021

2021 IEEE 22nd Latin American Test Symposium, LATS 2021

Type: Conference paper

DOI: 10.1109/LATS53581.2021.9651859 GOOGLE SCHOLAR
Data source: Scopus