TLP Generator Setup for Reliable Switching Characterization of Commercial GaN HEMTs
- Bernal, C.
- Jimenez, M.
- Andrade, F.
Actes de conférence:
2021 IEEE 22nd Latin American Test Symposium, LATS 2021
ISBN: 9781665420570
Année de publication: 2021
2021 IEEE 22nd Latin American Test Symposium, LATS 2021
Type: Communication dans un congrès