Evaluating the JEDEC standard JEP173, dynamic RDSon test method for GaN HEMTs

  1. Bernal, C.
  2. Jimenez, M.
  3. Andrade, F.
Proceedings:
Proceedings - IEEE International Symposium on Circuits and Systems

ISSN: 0271-4310

ISBN: 9781728133201

Year of publication: 2020

2020 IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Proceedings

Volume: 2020-October

Type: Conference paper

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Data source: Scopus