Automated characterization of reverse recovery parameters in high speed LDMOS devices
- Bernal, C.
- Jimenez, M.
ISSN: 1548-3746
ISBN: 9781509009169
Datum der Publikation: 2016
2016 IEEE 59th International Midwest Symposium on Circuits and Systems, MWSCAS 2016
Ausgabe: 0
Art: Konferenz-Beitrag