Automated characterization of reverse recovery parameters in high speed LDMOS devices

  1. Bernal, C.
  2. Jimenez, M.
Actas:
Midwest Symposium on Circuits and Systems

ISSN: 1548-3746

ISBN: 9781509009169

Ano de publicación: 2016

2016 IEEE 59th International Midwest Symposium on Circuits and Systems, MWSCAS 2016

Volume: 0

Tipo: Achega congreso

DOI: 10.1109/MWSCAS.2016.7870124 GOOGLE SCHOLAR
Fonte de datos: Scopus