Automated wafer-level measurement of LDMOS reverse recovery parameters

  1. Rodríguez Latorre, J.A.
  2. Jiménez, M.A.
  3. Palomera, R.
Actes de conférence:
Midwest Symposium on Circuits and Systems

ISSN: 1548-3746

ISBN: 9781467325264

Année de publication: 2012

2012 IEEE 55th International Midwest Symposium on Circuits and Systems, MWSCAS 2012

Pages: 1072-1075

Type: Communication dans un congrès

DOI: 10.1109/MWSCAS.2012.6292209 GOOGLE SCHOLAR
La source de données: Scopus