Permittivity characterization from open-end microstrip line measurements

  1. Hinojosa, J.
Revue:
Microwave and Optical Technology Letters

ISSN: 0895-2477

Année de publication: 2007

Volumen: 49

Número: 6

Pages: 1371-1374

Type: Article

DOI: 10.1002/MOP.22410 GOOGLE SCHOLAR