Defect detection in textures through the use of entropy as a means for automatically selecting the wavelet decomposition level
- Navarro, P.J.
- Fernández-Isla, C.
- Alcover, P.M.
- Suardíaz, J.
Journal:
Sensors (Switzerland)
ISSN: 1424-8220
Year of publication: 2016
Volume: 16
Issue: 8
Type: Article
DOI:
10.3390/S16081178
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HANDLE:
https://hdl.handle.net/10317/13687
Repositorio Digital de la Universidad Politécnica de Cartagena (UPCT):
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