Defect detection in textures through the use of entropy as a means for automatically selecting the wavelet decomposition level
- Navarro, P.J.
- Fernández-Isla, C.
- Alcover, P.M.
- Suardíaz, J.
Journal:
Sensors (Switzerland)
ISSN: 1424-8220
Year of publication: 2016
Volume: 16
Issue: 8
Type: Article