Fixed Pattern Noise Analysis for Feature Descriptors in CMOS APS Images

  1. Zapata-Pérez, J.
  2. Doménech-Asensi, G.
  3. Ruiz-Merino, R.
  4. Martínez-Álvarez, J.J.
  5. Fernández-Berni, J.
  6. Carmona-Galán, R.
Journal:
Sensing and Imaging

ISSN: 1557-2072,  1557-2064

Year of publication: 2020

Volume: 21

Issue: 1

Type: Article

DOI: 10.1007/S11220-020-0278-3 GOOGLE SCHOLAR
Data source: Scopus