A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect

  1. Vales-Alonso, J.
  2. Munoz-Gea, J.P.
  3. Alcaraz, J.J.
Proceedings:
2015 5th International EURASIP Workshop on RFID Technology, EURFID 2015

ISBN: 9783200037359

Year of publication: 2015

Pages: 48-52

Type: Conference paper

DOI: 10.1109/EURFID.2015.7332384 GOOGLE SCHOLAR

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