A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect

  1. Vales-Alonso, J.
  2. Munoz-Gea, J.P.
  3. Alcaraz, J.J.
Aktak:
2015 5th International EURASIP Workshop on RFID Technology, EURFID 2015

ISBN: 9783200037359

Argitalpen urtea: 2015

Orrialdeak: 48-52

Mota: Biltzar ekarpena

DOI: 10.1109/EURFID.2015.7332384 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus