A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect

  1. Vales-Alonso, J.
  2. Munoz-Gea, J.P.
  3. Alcaraz, J.J.
Actas:
2015 5th International EURASIP Workshop on RFID Technology, EURFID 2015

ISBN: 9783200037359

Ano de publicación: 2015

Páxinas: 48-52

Tipo: Achega congreso

DOI: 10.1109/EURFID.2015.7332384 GOOGLE SCHOLAR
Fonte de datos: Scopus