A convolutional neural architecture: An application for defects detection in continuous manufacturing systems
- Calderon-Martinez, J.A.
- Campoy-Cervera, P.
Konferenzberichte:
Proceedings - IEEE International Symposium on Circuits and Systems
ISSN: 0271-4310
Datum der Publikation: 2003
Ausgabe: 5
Art: Konferenz-Beitrag