A convolutional neural architecture: An application for defects detection in continuous manufacturing systems

  1. Calderon-Martinez, J.A.
  2. Campoy-Cervera, P.
Aktak:
Proceedings - IEEE International Symposium on Circuits and Systems

ISSN: 0271-4310

Argitalpen urtea: 2003

Alea: 5

Mota: Biltzar ekarpena