A convolutional neural architecture: An application for defects detection in continuous manufacturing systems
- Calderon-Martinez, J.A.
- Campoy-Cervera, P.
Actes de conférence:
Proceedings - IEEE International Symposium on Circuits and Systems
ISSN: 0271-4310
Année de publication: 2003
Volumen: 5
Type: Communication dans un congrès