Five hole probe errors caused by fluctuating incidence

  1. Coull, J.
  2. Dickens, T.
  3. Ng, H.
  4. Serna, J.
Proceedings:
E3S Web of Conferences

ISSN: 2267-1242 2555-0403

Year of publication: 2022

Volume: 345

Type: Conference paper

DOI: 10.1051/E3SCONF/202234501006 GOOGLE SCHOLAR lock_openOpen access editor