Five hole probe errors caused by fluctuating incidence

  1. Coull, J.
  2. Dickens, T.
  3. Ng, H.
  4. Serna, J.
Aktak:
E3S Web of Conferences

ISSN: 2267-1242,  2555-0403

Argitalpen urtea: 2022

Alea: 345

Mota: Biltzar ekarpena

DOI: 10.1051/E3SCONF/202234501006 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus