Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopy

  1. Abad, J.
  2. González Martínez, J.F.
  3. Colchero, J.
Zeitschrift:
Review of Scientific Instruments

ISSN: 0034-6748

Datum der Publikation: 2013

Ausgabe: 84

Nummer: 4

Art: Artikel

DOI: 10.1063/1.4801460 GOOGLE SCHOLAR
Datenquelle: Scopus