Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopy

  1. Abad, J.
  2. González Martínez, J.F.
  3. Colchero, J.
Revue:
Review of Scientific Instruments

ISSN: 0034-6748

Année de publication: 2013

Volumen: 84

Número: 4

Type: Article

DOI: 10.1063/1.4801460 GOOGLE SCHOLAR
La source de données: Scopus