Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopy

  1. Abad, J.
  2. González Martínez, J.F.
  3. Colchero, J.
Revista:
Review of Scientific Instruments

ISSN: 0034-6748

Ano de publicación: 2013

Volume: 84

Número: 4

Tipo: Artigo

DOI: 10.1063/1.4801460 GOOGLE SCHOLAR
Fonte de datos: Scopus