Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopy

  1. Abad, J.
  2. González Martínez, J.F.
  3. Colchero, J.
Aldizkaria:
Review of Scientific Instruments

ISSN: 0034-6748

Argitalpen urtea: 2013

Alea: 84

Zenbakia: 4

Mota: Artikulua

DOI: 10.1063/1.4801460 GOOGLE SCHOLAR
Datuen iturria: Scopus