Grain boundary potential determination in polycrystalline silicon by the scanning light spot technique

  1. Martinez, J.
  2. Criado, A.
  3. Piqueras, J.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 1981

Volumen: 52

Número: 3

Pages: 1301-1305

Type: Article

DOI: 10.1063/1.329755 GOOGLE SCHOLAR
La source de données: Scopus