S-parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties

  1. Hinojosa, J.
  2. Faucon, L.
  3. Queffelec, P.
  4. Huret, F.
Revue:
Microwave and Optical Technology Letters

ISSN: 0895-2477

Année de publication: 2001

Volumen: 30

Número: 1

Pages: 65-69

Type: Article

DOI: 10.1002/MOP.1222 GOOGLE SCHOLAR
La source de données: Scopus