Defect levels in monocrystalline and polycrystalline silicon MOS devices: A comparison
- Garcia, B.J.
- Martinez, J.
- Piqueras, J.
ISSN: 0022-3727
Year of publication: 1985
Volume: 18
Issue: 4
Pages: 661-670
Type: Article
ISSN: 0022-3727
Year of publication: 1985
Volume: 18
Issue: 4
Pages: 661-670
Type: Article